An Automated Setup for the Characterization of Time-Based Degradation Effects Including the Process Variability in 40-nm CMOS Transistors
IEEE Transactions on Instrumentation and Measurement, Vol. 70, Haziran 2021, ISSN: 0018-9456
XHAFA XHESİLA, GÜNGÖRDÜ ALİ DOĞUŞ, EROL DİDEM, YAVUZ YAVUZHAN, YELTEN MUSTAFA BERKE