Scalable and efficient analog parametric fault identification
2013 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), San Jose, CA, USA/AMERİKA BİRLEŞİK DEVLETLERİ, 18 Kasım 2013, s. 387-392
YELTEN MUSTAFA BERKE,NATARAJAN SURİYAPRAKASH,XUE BİN,GOTETİ PRASHANT