The dependence of UMOSFET characteristics and reliability on geometry and processing
Semiconductor Science and Technology, Vol. 16, No. 6, Haziran 2001, s. 447-454, ISSN: 0268-1242
SULİMAN SA,GOLLAGUNTA NA,TRABZON LEVENT,HAO JİANG,RİDLEY RS,RS KNOEDLER,DOLNY RS,AWADELKARİM OSAMA,FONASH STEVE