Radiation pressure excitation of Low Temperature Atomic Force Magnetic Force Microscope LT AFM MFM in 4 300K Temperature Range
16th European Conference on Applications of Surface and Interface Analysis, ECASIA'15, Granada, İspanya, 28 Eylül 2015
KARCI ÖZGÜR,ÇELİK ÜMİT,UYSALLI YİĞİT,ÖZER HAKAN ÖZGÜR,ORAL AHMET