High sensitivity noncontact atomic force microscope scanning tunneling microscope nc AFM STM operating at subangstrom oscillation amplitudes for atomic resolution imaging and force spectroscopy
Review of Scientific Instruments, Vol. 74, No. 8, Ocak 2003, s. 3656, ISSN: 00346748
ORAL AHMET,GRİMBLE R A,ÖZER HAKAN ÖZGÜR,PETHİCA JOHN B